VLSI Fault Modeling and Testing Techniques

VLSI Fault Modeling and Testing Techniques
Author :
Publisher : Praeger
Total Pages : 216
Release :
ISBN-10 : UOM:39015029550335
ISBN-13 :
Rating : 4/5 (35 Downloads)

Book Synopsis VLSI Fault Modeling and Testing Techniques by : George W. Zobrist

Download or read book VLSI Fault Modeling and Testing Techniques written by George W. Zobrist and published by Praeger. This book was released on 1993 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in the integrated ciruit. Hierarchial models are needed that are easy to use at the transistor and functional levels. Stuck-open faults present severe testing problems in CMOS circuits, to overcome testing problems testable designs are utilized. Bridging faults are important due to the shrinking geometry of ICs. BIST PLA schemes have common features-controllability and observability - which are enhanced through additional logic and test points. Certain circuit topologies are more easily testable than others. The amount of reconvergent fan-out is a critical factor in determining realistic measures for determining test generation difficulty. Test implementation is usually left until after the VLSI data path has been synthesized into a structural description. This leads to investigation methodologies for performing design synthesis with test incorporation. These topics and more are discussed.


VLSI Fault Modeling and Testing Techniques Related Books

VLSI Fault Modeling and Testing Techniques
Language: en
Pages: 216
Authors: George W. Zobrist
Categories: Computers
Type: BOOK - Published: 1993 - Publisher: Praeger

DOWNLOAD EBOOK

VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in t
VLSI Design and Test for Systems Dependability
Language: en
Pages: 792
Authors: Shojiro Asai
Categories: Technology & Engineering
Type: BOOK - Published: 2018-07-20 - Publisher: Springer

DOWNLOAD EBOOK

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design a
Delay Fault Testing for VLSI Circuits
Language: en
Pages: 201
Authors: Angela Krstic
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, t
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Language: en
Pages: 690
Authors: M. Bushnell
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there
VLSI Test Principles and Architectures
Language: en
Pages: 809
Authors: Laung-Terng Wang
Categories: Technology & Engineering
Type: BOOK - Published: 2006-08-14 - Publisher: Elsevier

DOWNLOAD EBOOK

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve pro