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VLSI Fault Modeling and Testing Techniques
Language: en
Pages: 216
Authors: George W. Zobrist
Categories: Computers
Type: BOOK - Published: 1993 - Publisher: Praeger

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VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in t
Delay Fault Testing for VLSI Circuits
Language: en
Pages: 201
Authors: Angela Krstic
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, t
VLSI Fault Modeling and Testing Techniques
Language: en
Pages: 0
Authors: George W. Zobrist
Categories: Psychology
Type: BOOK - Published: 1993 - Publisher: Praeger

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VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in t
Test Generation of Crosstalk Delay Faults in VLSI Circuits
Language: en
Pages: 161
Authors: S. Jayanthy
Categories: Technology & Engineering
Type: BOOK - Published: 2018-09-20 - Publisher: Springer

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This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Language: en
Pages: 690
Authors: M. Bushnell
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media

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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there