The Growth and Atomic Structure of the Silicon(111)-indium Interface Determined by Surface X-ray Diffraction
Author | : Mark Simon Finney |
Publisher | : |
Total Pages | : 0 |
Release | : 1992 |
ISBN-10 | : OCLC:504643592 |
ISBN-13 | : |
Rating | : 4/5 (92 Downloads) |
Download or read book The Growth and Atomic Structure of the Silicon(111)-indium Interface Determined by Surface X-ray Diffraction written by Mark Simon Finney and published by . This book was released on 1992 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: