The Effect of Hot-carrier and Fowler-Nordheim Injection on VLSI MOSFET at Room and Cryogenic Temperatures
Author | : Jen-Tai Hsu |
Publisher | : |
Total Pages | : 332 |
Release | : 1993 |
ISBN-10 | : OCLC:42998401 |
ISBN-13 | : |
Rating | : 4/5 (01 Downloads) |
Download or read book The Effect of Hot-carrier and Fowler-Nordheim Injection on VLSI MOSFET at Room and Cryogenic Temperatures written by Jen-Tai Hsu and published by . This book was released on 1993 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt: