Studies on Hot-Carrier Reliability in High-Voltage MOSFETs
Author | : 李佳叡 |
Publisher | : |
Total Pages | : 129 |
Release | : 2008 |
ISBN-10 | : OCLC:713168354 |
ISBN-13 | : |
Rating | : 4/5 (54 Downloads) |
Book Synopsis Studies on Hot-Carrier Reliability in High-Voltage MOSFETs by : 李佳叡
Download or read book Studies on Hot-Carrier Reliability in High-Voltage MOSFETs written by 李佳叡 and published by . This book was released on 2008 with total page 129 pages. Available in PDF, EPUB and Kindle. Book excerpt: