Millimetre-wave Device Characterization for Nano-CMOS IC Design [microform]
Author | : Mangan, Alain Marc |
Publisher | : Library and Archives Canada = Bibliothèque et Archives Canada |
Total Pages | : 188 |
Release | : 2005 |
ISBN-10 | : 0494072695 |
ISBN-13 | : 9780494072691 |
Rating | : 4/5 (95 Downloads) |
Download or read book Millimetre-wave Device Characterization for Nano-CMOS IC Design [microform] written by Mangan, Alain Marc and published by Library and Archives Canada = Bibliothèque et Archives Canada. This book was released on 2005 with total page 188 pages. Available in PDF, EPUB and Kindle. Book excerpt: At the 90-nm node, silicon technologies have reached a point where the transistor fT and f MAX simultaneously exceed 150 GHz, with a 1.2 V supply. With low fabrication costs for high volumes of circuits, RF-CMOS technologies are ideally suited to realize exciting new high bandwidth consumer products that operate in the mm-wave regime. Before this can happen, models of both active and passive devices will require a high degree of accuracy from DC, all the way up to mm-wave frequencies. This thesis presents new techniques that help leverage the power of measurements to characterize and model devices of nano-CMOS technologies well into the mm-wave regime. In particular, two new de-embedding techniques are devised in order to improve measurement accuracy, and reduce wafer area consumption. Moreover, the measured characteristics of various microstrip lines, varactors, and n-MOSFETs fabricated in a 90-nm RF-CMOS technology are analyzed in order to identify optimal geometries for high frequency design. An extraction methodology for a scalable physical model of accumulation-mode MOS varactors is also included.