Metallization for Self Aligned Technology: Cooperative Research and Development Final Report, CRADA Number CRD-08-295

Metallization for Self Aligned Technology: Cooperative Research and Development Final Report, CRADA Number CRD-08-295
Author :
Publisher :
Total Pages : 0
Release :
ISBN-10 : OCLC:1407169264
ISBN-13 :
Rating : 4/5 (64 Downloads)

Book Synopsis Metallization for Self Aligned Technology: Cooperative Research and Development Final Report, CRADA Number CRD-08-295 by :

Download or read book Metallization for Self Aligned Technology: Cooperative Research and Development Final Report, CRADA Number CRD-08-295 written by and published by . This book was released on 2012 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this CRADA NREL will modify/develop metallization inks that are compatible with 1366 Technologies technology. Various methods of deposition will be used to apply the inks to the textured silicon substrates. The goal of the project is to minimize the contact resistance while maximizing the cell efficiency.


Metallization for Self Aligned Technology: Cooperative Research and Development Final Report, CRADA Number CRD-08-295 Related Books

Metallization for Self Aligned Technology: Cooperative Research and Development Final Report, CRADA Number CRD-08-295
Language: en
Pages: 0
Authors:
Categories:
Type: BOOK - Published: 2012 - Publisher:

DOWNLOAD EBOOK

In this CRADA NREL will modify/develop metallization inks that are compatible with 1366 Technologies technology. Various methods of deposition will be used to a
Principles of Infrared Technology
Language: en
Pages: 585
Authors: John Lester Miller
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

This book is about general infrared (IR) engineering, technology, practices, and principles as they apply to modem imaging systems. An alternative title to this
Measurement Assurance Programs
Language: en
Pages: 76
Authors: Brian C. Belanger
Categories: Calibration
Type: BOOK - Published: 1984 - Publisher:

DOWNLOAD EBOOK

Technology at a Glance
Language: en
Pages: 4
Authors:
Categories: Research
Type: BOOK - Published: 1995 - Publisher:

DOWNLOAD EBOOK

National Semiconductor Metrology Program
Language: en
Pages: 146
Authors: National Institute of Standards and Technology (U.S.)
Categories: Semiconductors
Type: BOOK - Published: 1995 - Publisher:

DOWNLOAD EBOOK