Materials Reliability in Microelectronics III: Volume 309

Materials Reliability in Microelectronics III: Volume 309
Author :
Publisher :
Total Pages : 520
Release :
ISBN-10 : UCSD:31822016911422
ISBN-13 :
Rating : 4/5 (22 Downloads)

Book Synopsis Materials Reliability in Microelectronics III: Volume 309 by : Kenneth P. Rodbell

Download or read book Materials Reliability in Microelectronics III: Volume 309 written by Kenneth P. Rodbell and published by . This book was released on 1993-08-31 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.


Materials Reliability in Microelectronics III: Volume 309 Related Books

Materials Reliability in Microelectronics III: Volume 309
Language: en
Pages: 520
Authors: Kenneth P. Rodbell
Categories: Technology & Engineering
Type: BOOK - Published: 1993-08-31 - Publisher:

DOWNLOAD EBOOK

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Materials Reliability in Microelectronics III:
Language: en
Pages: 514
Authors: Kenneth P. Rodbell
Categories: Technology & Engineering
Type: BOOK - Published: 2014-06-05 - Publisher: Cambridge University Press

DOWNLOAD EBOOK

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Electromigration in Metals
Language: en
Pages: 433
Authors: Paul S. Ho
Categories: Science
Type: BOOK - Published: 2022-05-12 - Publisher: Cambridge University Press

DOWNLOAD EBOOK

Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics an
Diagnostic Techniques for Semiconductor Materials Processing: Volume 324
Language: en
Pages: 536
Authors: O. J. Glembocki
Categories: Technology & Engineering
Type: BOOK - Published: 1994-07 - Publisher:

DOWNLOAD EBOOK

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Materials Aspects of X-Ray Lithography: Volume 306
Language: en
Pages: 320
Authors: George K. Celler
Categories: Technology & Engineering
Type: BOOK - Published: 1993-10-27 - Publisher:

DOWNLOAD EBOOK

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.