Evaluation of Device Performance and Hot-carrier Reliability for an N-channel MOSFET Using NO-nitrided Gate Dielectric
| Author | : Allen P. Lo |
| Publisher | : |
| Total Pages | : 182 |
| Release | : 1999 |
| ISBN-10 | : OCLC:222898154 |
| ISBN-13 | : |
| Rating | : 4/5 (54 Downloads) |
Book Synopsis Evaluation of Device Performance and Hot-carrier Reliability for an N-channel MOSFET Using NO-nitrided Gate Dielectric by : Allen P. Lo
Download or read book Evaluation of Device Performance and Hot-carrier Reliability for an N-channel MOSFET Using NO-nitrided Gate Dielectric written by Allen P. Lo and published by . This book was released on 1999 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt:
