Download or read book Design of Negative Bias Temperature Instability (NBTI) Tolerant Register File written by Saurabh Eknath Kothawade and published by . This book was released on 2011 with total page 58 pages. Available in PDF, EPUB and Kindle. Book excerpt: PUBLIC ABSTRACT: Negative Bias Temperature Instability (NBTI) is becoming a major reliability problem in the semiconductor industry. As time passes, NBTI reduces the capacity of performing correct computations in the microprocessor. Hence, after certain time period, the microprocessor may fail to work as we expect, causing failure of the entire system it is part of. In this research, we study the root cause of the failure due to NBTI effect. Based on our findings, we propose multiple methods to reduce the negative impact of NBTI on a microprocessor. We build a comprehensive experimental setup to consider real world effects in a microprocessor. We evaluate our methods against the previous work and find that our methods substantially improve the processor reliability. This research could be useful in the future to extend lifetime of the processor.