Characterization of Hot-carriers Induced Degradation in Mosfets Through Gate Capacitances Measurement at Room and Cryogenic Temperatures
Author | : Clement Che Ta Hsu |
Publisher | : |
Total Pages | : 220 |
Release | : 2001 |
ISBN-10 | : OCLC:223407106 |
ISBN-13 | : |
Rating | : 4/5 (06 Downloads) |
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