Characterization of Hot-carrier Degradation in MOSFET's by Noise and Surface Recombination Currents
| Author | : Amanda Shiu-Tan Cheng |
| Publisher | : |
| Total Pages | : 76 |
| Release | : 1996 |
| ISBN-10 | : OCLC:37102652 |
| ISBN-13 | : |
| Rating | : 4/5 (52 Downloads) |
Book Synopsis Characterization of Hot-carrier Degradation in MOSFET's by Noise and Surface Recombination Currents by : Amanda Shiu-Tan Cheng
Download or read book Characterization of Hot-carrier Degradation in MOSFET's by Noise and Surface Recombination Currents written by Amanda Shiu-Tan Cheng and published by . This book was released on 1996 with total page 76 pages. Available in PDF, EPUB and Kindle. Book excerpt:
