2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
| Author | : IEEE Staff |
| Publisher | : |
| Total Pages | : |
| Release | : 2016-07-18 |
| ISBN-10 | : 1467382604 |
| ISBN-13 | : 9781467382601 |
| Rating | : 4/5 (04 Downloads) |
Book Synopsis 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) by : IEEE Staff
Download or read book 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) written by IEEE Staff and published by . This book was released on 2016-07-18 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: IPFA is devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability, yield and performance, especially those related to advanced process technologies
