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The Growth and Atomic Structure of the Silicon(111)-indium Interface Determined by Surface X-ray Diffraction

$The Growth and Atomic Structure of the Silicon(111)-indium Interface Determined by Surface X-ray Diffraction$

Author	: Mark Simon Finney
Publisher	:
Total Pages	: 0
Release	: 1992
ISBN-10	: OCLC:504643592
ISBN-13	:
Rating	: 4/5 (92 Downloads)

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Book Synopsis The Growth and Atomic Structure of the Silicon(111)-indium Interface Determined by Surface X-ray Diffraction by : Mark Simon Finney

Download or read book The Growth and Atomic Structure of the Silicon(111)-indium Interface Determined by Surface X-ray Diffraction written by Mark Simon Finney and published by . This book was released on 1992 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

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