Studies on Hot-Carrier Reliability in High-Voltage MOSFETs

Studies on Hot-Carrier Reliability in High-Voltage MOSFETs
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Publisher :
Total Pages : 129
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ISBN-10 : OCLC:713168354
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Book Synopsis Studies on Hot-Carrier Reliability in High-Voltage MOSFETs by : 李佳叡

Download or read book Studies on Hot-Carrier Reliability in High-Voltage MOSFETs written by 李佳叡 and published by . This book was released on 2008 with total page 129 pages. Available in PDF, EPUB and Kindle. Book excerpt:


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As device dimensions decrease, hot-carrier effects, which are due mainly to the presence of a high electric field inside the device, are becoming a major design