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The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization
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This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
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As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has co
Scanning Probe Microscopy of Functional Materials
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Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a
Scanning Probe Microscopy of Functional Materials
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The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization