Scanning Microscopy for Nanotechnology
Author | : Weilie Zhou |
Publisher | : Springer Science & Business Media |
Total Pages | : 533 |
Release | : 2007-03-09 |
ISBN-10 | : 9780387396200 |
ISBN-13 | : 0387396209 |
Rating | : 4/5 (00 Downloads) |
Download or read book Scanning Microscopy for Nanotechnology written by Weilie Zhou and published by Springer Science & Business Media. This book was released on 2007-03-09 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.