Nonlinear Device Measurement, Characterization, and Modeling for High Power RF Applications

Nonlinear Device Measurement, Characterization, and Modeling for High Power RF Applications
Author :
Publisher :
Total Pages : 122
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ISBN-10 : OCLC:872583405
ISBN-13 :
Rating : 4/5 (05 Downloads)

Book Synopsis Nonlinear Device Measurement, Characterization, and Modeling for High Power RF Applications by : Youngseo Ko

Download or read book Nonlinear Device Measurement, Characterization, and Modeling for High Power RF Applications written by Youngseo Ko and published by . This book was released on 2013 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt: Having characterized results under the developedmeasurement system, a new measurement based model with artificial neuron network (ANN) is finally proposed and applied to a SOI MOSFET device. The verification results demonstrate that the time-consuming measurement process can be dramatically reduced by using RTALP measurement data, and that fairly accurate large-signal RF device model can be easily extracted from these measurements using the ANN approach.


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