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Microelectronic Test Pattern NBS-3 for Evaluating the Resistivity-dopant Density Relationship of Silicon
Language: en
Pages: 64
Authors: Martin G. Buehler
Categories: Microelectronics
Type: BOOK - Published: 1976 - Publisher:

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Microelectronic Test Pattern NBS-4
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NBS Special Publication
Language: en
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Semiconductor Measurement Technology
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Microcircuit Reliability Bibliography
Language: en
Pages: 412
Authors:
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Type: BOOK - Published: 1978 - Publisher:

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