Hot-carrier reliability of strain-engineered MOSFETs
Author | : David Quest Kelly |
Publisher | : |
Total Pages | : 132 |
Release | : 2003 |
ISBN-10 | : OCLC:54715690 |
ISBN-13 | : |
Rating | : 4/5 (90 Downloads) |
Book Synopsis Hot-carrier reliability of strain-engineered MOSFETs by : David Quest Kelly
Download or read book Hot-carrier reliability of strain-engineered MOSFETs written by David Quest Kelly and published by . This book was released on 2003 with total page 132 pages. Available in PDF, EPUB and Kindle. Book excerpt: