Evaluation of Hot-carrier Induced Degradation in MOSFETs by Measurement at Cryogenic Temperatures
Author | : Sherry Shu Ting Yao |
Publisher | : |
Total Pages | : 200 |
Release | : 2000 |
ISBN-10 | : OCLC:48404393 |
ISBN-13 | : |
Rating | : 4/5 (93 Downloads) |
Book Synopsis Evaluation of Hot-carrier Induced Degradation in MOSFETs by Measurement at Cryogenic Temperatures by : Sherry Shu Ting Yao
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