Evaluation of Device Performance and Hot-carrier Reliability for an N-channel MOSFET Using NO-nitrided Gate Dielectric
Author | : Allen P. Lo |
Publisher | : |
Total Pages | : 182 |
Release | : 1999 |
ISBN-10 | : OCLC:222898154 |
ISBN-13 | : |
Rating | : 4/5 (54 Downloads) |
Download or read book Evaluation of Device Performance and Hot-carrier Reliability for an N-channel MOSFET Using NO-nitrided Gate Dielectric written by Allen P. Lo and published by . This book was released on 1999 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt: