Comparison of Hot Electron Effects in MOSFETs with Silicon Dioxide and Thermally Nitrided Gate Dielectrics
| Author | : Abhijit Gupta |
| Publisher | : |
| Total Pages | : 400 |
| Release | : 1988 |
| ISBN-10 | : OCLC:19900228 |
| ISBN-13 | : |
| Rating | : 4/5 (28 Downloads) |
Book Synopsis Comparison of Hot Electron Effects in MOSFETs with Silicon Dioxide and Thermally Nitrided Gate Dielectrics by : Abhijit Gupta
Download or read book Comparison of Hot Electron Effects in MOSFETs with Silicon Dioxide and Thermally Nitrided Gate Dielectrics written by Abhijit Gupta and published by . This book was released on 1988 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt:
