Characterization of Hot-carriers Induced Degradation in Mosfets Through Gate Capacitances Measurement at Room and Cryogenic Temperatures
| Author | : Clement Che Ta Hsu |
| Publisher | : |
| Total Pages | : 220 |
| Release | : 2001 |
| ISBN-10 | : OCLC:223407106 |
| ISBN-13 | : |
| Rating | : 4/5 (06 Downloads) |
Book Synopsis Characterization of Hot-carriers Induced Degradation in Mosfets Through Gate Capacitances Measurement at Room and Cryogenic Temperatures by : Clement Che Ta Hsu
Download or read book Characterization of Hot-carriers Induced Degradation in Mosfets Through Gate Capacitances Measurement at Room and Cryogenic Temperatures written by Clement Che Ta Hsu and published by . This book was released on 2001 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt:
