Download or read book 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) written by IEEE Staff and published by . This book was released on 2018-07-16 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: IPFA 2018 is devoted to the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of wear out and failure in conventional and new CMOS devices, in turn resulting in improved knowhow of the physics of device circuit module failure that serves as critical input for future design for reliability