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Language: en
Pages: 412
Pages: 412
Type: BOOK - Published: 2014-08-19 - Publisher: John Wiley & Sons
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry
Language: en
Pages: 67
Pages: 67
Type: BOOK - Published: 2015-10-16 - Publisher: Morgan & Claypool Publishers
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of m
Language: en
Pages: 742
Pages: 742
Type: BOOK - Published: 2013 - Publisher: IM Publications
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 y
Language: en
Pages: 325
Pages: 325
Type: BOOK - Published: 2013-04-17 - Publisher: John Wiley & Sons
Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging m
Language: en
Pages: 392
Pages: 392
Type: BOOK - Published: 1989-11-16 - Publisher: Wiley-Interscience
Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analyt
