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Random Testing of Digital Circuits
Language: en
Pages: 496
Authors: Rene David
Categories: Technology & Engineering
Type: BOOK - Published: 2020-11-25 - Publisher: CRC Press

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"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators,
Random Testing of Digital Circuits
Language: en
Pages: 508
Authors: Rene David
Categories: Technology & Engineering
Type: BOOK - Published: 2020-11-26 - Publisher: CRC Press

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"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators,
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Language: en
Pages: 690
Authors: M. Bushnell
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media

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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there
The Evolution of Fault-Tolerant Computing
Language: en
Pages: 467
Authors: A. Avizienis
Categories: Computers
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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For the editors of this book, as well as for many other researchers in the area of fault-tolerant computing, Dr. William Caswell Carter is one of the key figure
High-level Function and Delay Testing for Digital Circuits
Language: en
Pages: 292
Authors: Joonhwan Yi
Categories:
Type: BOOK - Published: 2002 - Publisher:

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