Applied Nonparametric Statistics in Reliability
Author | : M. Luz Gámiz |
Publisher | : Springer Science & Business Media |
Total Pages | : 238 |
Release | : 2011-02-14 |
ISBN-10 | : 9780857291189 |
ISBN-13 | : 0857291181 |
Rating | : 4/5 (89 Downloads) |
Download or read book Applied Nonparametric Statistics in Reliability written by M. Luz Gámiz and published by Springer Science & Business Media. This book was released on 2011-02-14 with total page 238 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nonparametric statistics has probably become the leading methodology for researchers performing data analysis. It is nevertheless true that, whereas these methods have already proved highly effective in other applied areas of knowledge such as biostatistics or social sciences, nonparametric analyses in reliability currently form an interesting area of study that has not yet been fully explored. Applied Nonparametric Statistics in Reliability is focused on the use of modern statistical methods for the estimation of dependability measures of reliability systems that operate under different conditions. The scope of the book includes: smooth estimation of the reliability function and hazard rate of non-repairable systems; study of stochastic processes for modelling the time evolution of systems when imperfect repairs are performed; nonparametric analysis of discrete and continuous time semi-Markov processes; isotonic regression analysis of the structure function of a reliability system, and lifetime regression analysis. Besides the explanation of the mathematical background, several numerical computations or simulations are presented as illustrative examples. The corresponding computer-based methods have been implemented using R and MATLAB®. A concrete modelling scheme is chosen for each practical situation and, in consequence, a nonparametric inference procedure is conducted. Applied Nonparametric Statistics in Reliability will serve the practical needs of scientists (statisticians and engineers) working on applied reliability subjects.