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Language: en
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Pages: 741
Type: BOOK - Published: 2003-03-27 - Publisher: Cambridge University Press
A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.
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Type: BOOK - Published: 2003-03-27 - Publisher: Cambridge University Press
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Type: BOOK - Published: 2011-03-24 - Publisher: Springer Science & Business Media
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of th
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Pages: 432
Type: BOOK - Published: 2015-03-23 - Publisher: World Scientific Publishing Company
Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging
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Pages: 543
Type: BOOK - Published: 2016-08-24 - Publisher: Springer
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussio
