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Language: en
Pages: 172
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Type: BOOK - Published: 2000 - Publisher: ASTM International
Annotation Contains papers from a January 1999 conference held in San Jose, California, describing concepts and metrology of Gate Dielectric Integrity (GDI) and
Language: en
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Type: BOOK - Published: 2003-12-01 - Publisher: CRC Press
The drive toward smaller and smaller electronic componentry has huge implications for the materials currently being used. As quantum mechanical effects begin to
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Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
Gate Dielectrics and MOS ULSIs provides necessary and sufficient information for those who wish to know well and go beyond the conventional SiO2 gate dielectric
Language: en
Pages: 565
Pages: 565
Type: BOOK - Published: 2006 - Publisher: The Electrochemical Society
This issue covers, in detail, all aspects of the physics and the technology of high dielectric constant gate stacks, including high mobility substrates, high di
